Minutes, IBIS Quality Committee

30 March 2010

11-12 AM EST (8-9 AM PST)

ROLL CALL
  Adam Tambone
* Anders Ekholm, Ericsson
  Barry Katz, SiSoft
  Benny Lazer
  Benjamin P Silva
  Bob Cox, Micron
* Bob Ross, Teraspeed Consulting Group
  Brian Arsenault
  David Banas, Xilinx
* Eckhard Lenski, Nokia Siemens Networks
  Eric Brock
  Guan Tao, Huawei Technologies
  Gregory R Edlund
  Hazem Hegazy
  Huang Chunxing, Huawei Technologies
  John Figueroa
  John Angulo, Mentor Graphics
  Katja Koller, Nokia Siemens Networks
  Kevin Fisher
  Kim Helliwell, LSI Logic
  Lance Wang, IOMethodology
  Lijun, Huawei
  Lynne Green, Green Streak Programs
* Mike LaBonte, Cisco Systems
  Mike Mayer, SiSoft
* Moshiul Haque, Micron Technology
  Muniswarareddy Vorugu, ARM Ltd
  Pavani Jella, TI
  Peter LaFlamme
  Randy Wolff, Micron Technology
  Radovan Vuletic, Qimonda
  Robert Haller, Enterasys
  Roy Leventhal, Leventhal Design & Communications
  Sherif Hammad, Mentor Graphics
  Tim Coyle, Signal Consulting Group
  Todd Westerhoff, SiSoft
  Tom Dagostino, Teraspeed Consulting Group
  Kazuyoshi Shoji, Hitachi
  Sadahiro Nonoyama

Everyone in attendance marked by *

NOTE: "AR" = Action Required.

-----------------------MINUTES ---------------------------
Mike LaBonte conducted the meeting.

Call for opens and IBIS related patent disclosures:

- No one declared a patent.

AR Review:

- Mike post outline
  - Done, but no announcement

New items:

Bob showed the IBIS Correlation Outline and made updates:
- Mike: Does any part of this not make sense?
- Anders: Why is there not a Simulation section?
- Mike changed Measurement to "Measurement and Simulation"
- Anders: The correlation has to check the same node on both sides
- Moshiul: The correlation setup belongs in section 3
- Anders: Why do we have Receiver Output correlation?
  - We deleted that
- Anders: Input correlation is not that same as others
- Mike: Is die capacitance comparison really correlation?
- Moshiul: This is effective capacitance as seen at the pin
- Anders: What will be our measurement points for that?
- Mike: Maybe we could drop Effective Capacitance correlation
- Anders and Moshiul wanted to keep it

Mike: Should correlation be against actual data in an IBIS file?
- Maybe it should always be against IBIS simulation, not IBIS data
- Moshiul: Some IBIS data should be checked directly
- Mike: I/V curves are extracted and recombined by simulators
  - Doing that and checking correlation could be worthwhile
- Anders: This can be simulator dependent
  - What is the scope of this?
- Anders: We should correlate the IBIS data, not simulators
- Bob: We should not make it a big project
  - The IBIS model is not the only variable
  - Measuring it through parasitics complicates things
- Mike:
  - There are two parts:
    - What to correlate
    - How to measure correlation
  - We should focus on the latter

Bob: We should keep the input section
- The effect of inputs on reflection is significant

Anders: Who would be using this document?
- Mike: IC vendors
- Moshiul: Mostly
- Mike: Maybe our document should have 2 sections:
  - sim-sim correlation
  - sim-data correlation

AR: Bob send updated IBIS Correlation outline to Mike
AR: Mike post updated IBIS Correlation outline to IQ web

Next meeting will be Apr 12

Meeting ended at 12:14 PM Eastern Time.